二硫化鉭晶體(1T) TaS2(Tantalum Sulfide) -1T
晶體尺寸:~8毫米
電學性能:半導體,電荷密度波(CDW),Mott相
晶體結構:六邊形
晶胞參數:a = b = 0.336 nm, c = 0.590 nm, α = β = 90°, γ = 120°
晶體類型:合成
晶體純度:>99.995%
X-ray diffraction on a Tantalum Disulfide single crystal aligned along the (001) plane. XRD on the 1T-TaS2 was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4, 5
Powder X-ray diffraction (XRD) of a single crystal 1T-TaS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal 1T-TaS2 by Energy-dispersive X-ray spectroscopy (EDX).